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Smithsonian National Museum of Natural History
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Department of Mineral Sciences

Izalco Volcano
Instrument
  • ION-TOF GmbH ToF-SIMS IV

Time of Flight-Secondary Ion Mass Spectroscopy, or ToF-SIMS, is a widely used technique in material sciences for the study of materials such as polymers, biomaterials, semi-conductors, metals, and geological samples. ToF-SIMS is a surface-sensitive analytical method that uses a pulsed primary ion beam (e.g., gallium or bismuth) to remove molecules from the surface of a sample. Spatial resolution of less than one micron and mass resolution of less than one atomic mass unit is achievable.

Recent studies using the instrument have quantified the boron content of blue diamonds and demonstrated the existence of hydrous apatite in rocks from the moon.

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